Particle Beam Systems and Technology

Third-party provider of service, upgrades, spare parts, consumables, and process development support for broad range of particle beam instrumentation, including Focused Ion Beam (FIB) systems manufactured by former Micrion Company, FIB and FIB/SEM equipment manufactured by FEI Company, Scanning Electron Microscopy (SEM) tools from various SEM manufacturers including industrial CD-SEM and DR-SEM tools made by Opal and Applied Materials.

Disclaimer

FEI, FEI Company, Micrion, Micrion 2500, Micrion 9500, Micrion 9800, Micrion 9000, Acura, FIB400, 400ACE, Quanta, Q3D, Strata, Vectra, Vectra 986, Vectra 986+, Vectra Vision, Vectra V65, V600, V600CE, Pre-Lens, Magnum, Sidewinder, Tomahawk are trademarks and property of FEI Company, Inc.

Opal, 7830Si, SemVision, Vera SEM, VeraSEM 3D, Nano SEM are trademarks and property of Applied Materials Company, Inc.

All trademarks are property of its respective owners and used for the sole purpose of accurately identifying serviced and supported equipment.

PBS&T, MEO Engineering Company, Inc., is a third-party service provider. It is not affiliated with and does not represent OEMs of the supported equipment.