MEO Engineering Company, Inc.

In course of providing third-party service and support for Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instruments during past 15 years we developed capability to test, troubleshoot, and repair multiple types of high-voltage and acceleration power supplies. Some supported models of 50kV FIB, 30kV FIB, and 30kV SEM High Voltage Power Supply (HVPS) units are listed below with flat-rate cost of repair and types of FIB and SEM instruments where these power supplies are used. We succesfully produced custom high-voltage power supplies for FIB, MBE, and SIMS research instrumentation at competitive prices - feel free to contact with your requirements!

50kV "Accel" power supplies for 9500, 9800, 9800FC, Vectra, and Acura FIB tools from former Micrion and FEI Companies

Flat repair price US$15,000 with typical lead time 4 weeks. Repair is covered by 90 days "return to base" warranty.

50kV "Bertan" power supplies used in 9500, 9800, 9800FC, Vectra, and Acura FIB tools from former Micrion and FEI Companies

Flat repair price US$15,000 with typical lead time 4 weeks. Repair is covered by 90 days "return to base" warranty.

50kV "HVPS" power supplies used in 9500, 9800, 9800FC, Vectra, and Acura FIB tools from former Micrion and FEI Companies 

Flat repair price US$15,000 with typical lead time 4 weeks. Repair is covered by 90 days "return to base" warranty.

52kV HIVOLT "HiTek Power" high-voltage power supplies for Focused Ion Beam (FIB) tools from FEI Company

Flat repair price US$15,000 with typical lead time 4 weeks. Repair is covered by 90 days "return to base" warranty.

50kV and 30kV "Spellman" power supplies for Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) tools from FEI Company and other OEMs

Unfortunatelly we came to conclusion that High Voltage Power Supplies for Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) tools designed and made by Spellman are not repairable. We would be happy to replace Spellman HVPS in your FIB, SEM, or dual-beam FIB/SEM tool by a compatible refurbished, tested, and covered by warranty high-voltage power supply from Bertran, Accel, or other supplies. Please inquire for current prices and availability.

30kV and 35kV "Accel" power supplies for Focused Ion Beam tools from FEI Company and other OEMs

Flat repair price US$15,000 with typical lead time 4 weeks. Repair is covered by 90 days "return to base" warranty.

30kV "DCG" power supplies for P2X, P3X, and OptiFIB Focused Ion Beam tools from Schumberger, NPTest, DCG, FEI Company 

Flat repair price US$15,000 with typical lead time 4 weeks. Repair is covered by 90 days "return to base" warranty.

30kV "Bertan" power supplies for older 9000, 2000, 9100, 2100 Focused Ion Beam tools from former Micrion Company

Flat repair price US$10,000 with typical lead time 4 weeks. Repair is covered by 90 days "return to base" warranty.

30kV "KLA" high voltage power supplies for Critical Dimension Scanning Electron Micriscope (CD-SEM) and Defect Review SEM (DR-SEM) tools from KLA-Tencor







Flat repair price US$10,000 with typical lead time 4 weeks. Repair is covered by 90 days "return to base" warranty.

Typical lead time for HVPS repair is between 2 to 4 weeks. Flat rate cost of repair apply only to units removed from otherwise functional FIB/SEM instrument without any attempts of DIY repair. Flat rate repair cost and typical lead time estimates are exclusive of shipment, crating, packaging, custom duties, etc... - all and any such excluded costs would be added to the overall cost of repair.

You can find us:

Web: www.partbeamsystech.com

Web: www.freudlabs.com

E-Mail: info@partbeamsystech.com

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Disclaimer:

MEO Engineering Company, Inc., D.B.A. "PBS&T" ("Particle Beam Systems and Technology") provides range of technological solutions, including third-party service, support, parts, and consumables for FIB, SEM, and dual-beam FIB/SEM instrumentation. PBS&T does not represent, not affiliated with, and not supported by OEMs of FIB, SEM, and FIB/SEM instrumentation. All trademarks identifying supported FIB, SEM, and FIB/SEM equipment and components are property of their respective owners and nominatively used for the sole purpose of accurately identifying equipment compatible with the parts and services provided by PBS&T, MEO Engineering Company, Inc.